Authorized Sales Representative
STAR Market: 688200 • 10,000 testers delivered worldwide to IDMs and OSATs as of October 2026.
Authorized Partner
Next-Gen SoC Flagship
Liquid-cooled test head handling complex analog and high-speed digital pins for data centre, automotive, and IoT devices, including FPGA, MCU, and wireless connectivity.
"One Platform for All" architecture engineered for high-pin-count processors, automotive microcontrollers, and high-speed digital devices.
| Analog Pins | > 2,000 Channels |
|---|---|
| Digital Speed | > 4,000 @ 1.6 Gbps |
| Power Delivery | > 2,000A |
| Configuration | 20 / 8 Slots |
PMIC & Mixed-Signal
32-Slot Test Head
All-in-one test head supporting up to 32 parallel sites for PMIC, Smart Power Stages (SPS), IPD, and Battery Management (BMS).
| Capacity | 300–500+ analog channels in the test head |
|---|---|
| Throughput | Up to 32 parallel test sites (Hard docking) |
| Test Head | All-in-one architecture |
Power & GaN/SiC Modules
Up to 26 Slots
Universal power discrete and module tester for Wide Bandgap (SiC/GaN), MOSFETs, IGBTs, Known Good Die (KGD), and automotive power bricks.
| Power Envelope | Up to 2000V / 2000A DC and 1200V / 18,000A short-circuit (AXE-PLUS) |
|---|---|
| Variants | AXE-PM (Power Modules), AXE-FET (GaN/SiC FETs), AXE-PLUS |
| Programming | Open C++ test development |
AXE-PM
AXE-FET
AXE-PLUS
Access our consolidated 2026 Equipment & Solutions Line Card matrix in a clean, print-ready layout.